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1. The valence and speciation of sulfur in glasses by X-ray absorption spectroscopy

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2. The refiEXAFS station at the GILDA beamline (BM08) of ESRF


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3. Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films


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4. Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy


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5. Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction


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6. Natural hybrid organic-inorganic photovoltaic devices


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7. Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study


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8. Electron spectroscopy study in the NbN growth for NbN/AlN interfaces


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9. Inx Ga(1-x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS)


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10. X-ray absorption and photoelectron spectroscopic studies of graphite and single-walled carbon nanotubes: oxygen effect


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