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1. The refiEXAFS station at the GILDA beamline (BM08) of ESRF


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2. Electrical and mechanical characterization of coated conductors lap joints


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3. Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy


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4. Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction


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5. Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films


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6. Natural hybrid organic-inorganic photovoltaic devices


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7. Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study


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8. Inx Ga(1-x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS)


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9. Studenti-Ricercatori per cinque giorni "stage a Tor Vergata


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10. Electron spectroscopy study in the NbN growth for NbN/AlN interfaces


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