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1. Le programme alimentaire mondial


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2. Characteristics of boron /delta - doped diamond for electronic applications

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http://mediatum.ub.tum.de/node?id=796824
http://mediatum.ub.tum.de/doc/796824/document.pdf  

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3. Analysis of Ultra-Thin HfO2/SiON/Si(001): Comparison of Three Different Techniques

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4. Extracorporeal liver support with the molecular adsorbent recirculating system (mars) in patients with acute-on-chronic liver failure (aoclf). the relief trial

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5. Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPS

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6. Assessment of the near-surface profiling capabilities of SIMS

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7. Characterization of the B and As pile-up at the Si-SiO2 interface

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8. Near-surface B/As profiling with SIMS: (in)solvable problems?

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9. An (un)solvable problem in SIMS: B-interfacial profiling

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10. Errors in near-surface and interfacial profiling of boron and arsenic

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